The use of the Peak Force Quantitative Nanomechanical Mapping AFM-based method for high-resolution Young’s modulus measurement of polymers
نویسندگان
چکیده
PeakForce Quantitative Nanomechanical Mapping (QNM) is a new atomic force microscopy technique for measuring the Young’s modulus of materials with high spatial resolution and surface sensitivity, by probing at the nanoscale. In the present work, modulus results from PeakForceTM QNMTM using three different probes are presented for a number of different polymers with a range of Young’s moduli that were measured independently by Instrumented (nano) Indentation Testing (IIT). The results from the diamond and silicon AFM probes were consistent and in reasonable agreement with IIT values for the majority of samples. It is concluded that the technique is complimentary to IIT; calibration requirements and potential improvements to the technique are discussed.
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